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Pickering Expands Analog Output Portfolio for Functional Test and HIL

by Chief Editor June 23, 2026
written by Chief Editor

Pickering Interfaces has released three new PXI/PXIe analog output modules designed to improve signal sourcing and sensor simulation for hardware-in-the-loop (HIL) and functional test environments. According to the company, these modules provide high-density waveform generation, precision digital-to-analog converter (DAC) outputs, and thermocouple simulation to help engineers reduce rack space and system complexity in automated test setups.

How do high-density modules change HIL testing?

Modern hardware-in-the-loop (HIL) testing requires simulating increasingly complex sensor environments without ballooning the physical footprint of the test rack. Pickering Interfaces’ new modules, specifically the 41-625 and 43-625 waveform generators, address this by offering up to 32 independent output channels within a single 3U PXI/PXIe slot. Stephen Jenkins, Simulation Product Manager at Pickering, states that this density allows for more realistic stimulation of embedded controllers compared to traditional, general-purpose voltage sources. By consolidating channels, engineers can replicate multi-channel stimulus conditions—such as complex accelerometer inputs—without the need for additional external switching hardware.

How do high-density modules change HIL testing?
Did you know?
High-density modular instrumentation can significantly reduce the risk of system obsolescence. By using an open-platform standard like PXI, engineers can replace individual modules as technology evolves rather than decommissioning an entire proprietary test rack.

Why is thermocouple simulation critical for automated systems?

Thermocouple simulation requires extreme precision to accurately mirror the behavior of temperature sensors in aerospace, automotive, and industrial applications. The new 41-761A modules from Pickering provide microvolt-level simulation with built-in fault insertion. According to the manufacturer, these modules handle common-mode voltages and support multiple cold junction configurations, which are essential for validating the safety systems of embedded controllers. By integrating fault insertion directly into the module, engineers can simulate wiring failures or sensor degradation without adding external circuit complexity, which often introduces noise or signal degradation into the test loop.

What is the role of DAC modules in fault injection?

The 41-770 PXI and 43-770 PXIe DAC modules are engineered to provide fully isolated analog outputs with programmable voltage and current ranges. These modules allow for voltage outputs up to ±40 V and current outputs up to ±20 mA. A key feature for modern testing is the ability to simulate open-circuit conditions, a standard requirement for fault-injection testing. By including a hardware interlock, Pickering aims to protect both the device under test (DUT) and the broader test infrastructure from electrical damage during these simulated stress tests.

Introducing Pickering's 5A Battery Simulator for BMS Testing, Battery Emulation & HIL Simulation

Comparison: Traditional vs. Modular Simulation

Comparison: Traditional vs. Modular Simulation
Feature Traditional Systems Modular PXI/PXIe
Channel Density Low High (up to 32 ch/slot)
Fault Insertion External hardware required Integrated

Frequently Asked Questions

  • What software environments support these modules?
    Pickering Interfaces provides driver support for Windows and Linux, with APIs available for C, Python, C#, MATLAB, Simulink, and LabVIEW.
  • Do these modules include a warranty?
    Yes, all standard Pickering Interfaces products include a three-year warranty and long-term product support, according to the company.
  • Can these modules simulate sensor failures?
    Yes, the DAC and thermocouple modules are designed for fault-injection testing, allowing for the simulation of open-circuit conditions and other common sensor-level faults.
Pro Tip:
When planning your HIL test bench, prioritize modules with built-in isolation. This reduces the need for external signal conditioning, which minimizes the introduction of electromagnetic interference (EMI) into your low-voltage sensor lines.

For more information on these new modules or to discuss your specific testing requirements, visit the Pickering Interfaces website. Have questions about integrating PXI modules into your current HIL setup? Leave a comment below to share your experiences.

June 23, 2026 0 comments
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